%0 Journal Article
%T IDDT test generation algorithm based on chaotic search<br>一种基于混沌搜索的I_（DDT）测试产生算法
%A 汪琼
%A 邝继顺
%A 邓杭剑
%J 计算机应用研究
%D 2007
%I 
%X This paper proposed a new algorithm for transient current test (IDDT) generation. The algorithm used backward implication in improved FAN algorithm to activate fault and mapped test vector space to the chaotic space, adopted chaotic search to find out the suitable testing pairs. SPICE simulation experiments were done on the test vectors generated by this algorithm. The simulation results show that it is available to use chaotic search for IDDT test generation.
%K transient current
%K chaotic search
%K backward implication
%K test generation
%K waveform simulator<br>瞬态电流
%K 混沌搜索
%K 反向蕴涵
%K 测试产生
%K 波形模拟器
%U http://www.alljournals.cn/get_abstract_url.aspx?pcid=5B3AB970F71A803DEACDC0559115BFCF0A068CD97DD29835&cid=8240383F08CE46C8B05036380D75B607&jid=A9D9BE08CDC44144BE8B5685705D3AED&aid=DCE72775D4A2C4EF4542431B07DF392F&yid=A732AF04DDA03BB3&vid=B91E8C6D6FE990DB&iid=59906B3B2830C2C5&sid=BB0EA31DB1B01173&eid=6700D0D256586E73&journal_id=1001-3695&journal_name=计算机应用研究&referenced_num=0&reference_num=9