%0 Journal Article
%T ANALYSIS OF PASSIVE FILMS OF Al ALLOYS BY XPS DEPTH PROFILE<br>
%J 金属学报
%D 1987
%I 
%X An XPS depth profile analysis was made of the passive films on one Al-Mg alloy and two Al-Cu alloys. It was clarified that in the K_2Cr_2O_7 treated passive films on these alloys, a certain amount of Cr_2O_3 is appeared besides the majority of A1_2O_3. Thus the long-time argument about the presence of Cr_2O_3 in now settled. It was also observed that in the passive films obtained by treatment with N_2-con-taining passivation agent, some A1N and metallic complexes are detected in addition to A1_2O_3. Futhermore, No Cu is signaled in the passive film on two Al-Cu alloys obtained by either K_2Cr_2O_7 or N_2-containing passivation agent, and Cu is shielded by the passive film. It is interesting that a definite Mg peak may be observed on these two passive films although Mg content in Al-Cu alloy is very low, but disappeared after sputtering 5 min.
%U http://www.alljournals.cn/get_abstract_url.aspx?pcid=5B3AB970F71A803DEACDC0559115BFCF0A068CD97DD29835&cid=AB188D3B70B071C57EB64E395D864ECE&jid=B061E1135F1CBDEE96CD96C109FEAD65&aid=CBF5A3EE599F104090DB4E3CFE73A598&yid=9C2DB0A0D5ABE6F8&vid=EA389574707BDED3&iid=0B39A22176CE99FB&sid=E089FDF3CDAE8561&eid=F8035C8B7D8A4264&journal_id=0412-1961&journal_name=金属学报&referenced_num=0&reference_num=1