%0 Journal Article
%T ELLIPSOMETRIC ANALYSIS OF ION-IMPLANTED SURFACE LAYER ON METAL<br>
%A SUI Senfang
%A CHEN Heming
%A <br>
%J 金属学报
%D 1984
%I 
%X An ellipsometric method is prcscnted for the analysis of the ion-implanted surface layer on metal. Experimental results indicate that the variation of the pseudo-imaginary part of the dielectric function can give the information about the transformation from the crystalline into amorphous state of the surface layer on rectal by ion implantation.
%U http://www.alljournals.cn/get_abstract_url.aspx?pcid=5B3AB970F71A803DEACDC0559115BFCF0A068CD97DD29835&cid=AB188D3B70B071C57EB64E395D864ECE&jid=B061E1135F1CBDEE96CD96C109FEAD65&aid=A6C0A09A99198BB0F397B82429E1F1E1&yid=36250D1D6BDC99BD&vid=A04140E723CB732E&iid=CA4FD0336C81A37A&sid=480C51B1F0CE0AB6&eid=8477411EEDB08A86&journal_id=0412-1961&journal_name=金属学报&referenced_num=0&reference_num=1