%0 Journal Article
%T XRD AND RAMAN SCATTERING ANALYSIS ON CHROMIUMDOPED 0.2PZN-0.8PZT PIEZOCERAMICS<br>铬掺杂0.2PZN-0.8PZT压电陶瓷的XRD和Raman散射分析
%A LU Peng-Xian
%A XU De-He
%A MA Qiu-Hu
%A WANG Gai-Min
%A HOU Yong-Gai
%A ZHOU Wen-Jun
%A LI Zheng-Xin
%A <br>路朋献
%A 许德合
%A 马秋花
%A 王改民
%A 侯永改
%A 周文俊
%A 栗政新
%J 红外与毫米波学报
%D 2007
%I Science Press
%X The microstructural changes originated from Cr doping in 0.2PZN-0.8PZT piezoelectric ceramics were investigated by means of XRD and Raman scattering.The phase transition from rhombohedral to tetragonal and the increase of crystal tetragonallity are caused by Cr addition.The studies about the lattice parameters and the phase transition through Raman scattering are confirmed by XRD.So,the microstructural changes induced by doping in the piezoelectric ceramics with tetragonal and rhombohedral structures simultaneously can be revealed through the analysis of the Raman vibration modes in different structures.
%K Cr doping
%K 0
%K 2PZN-0
%K 8PZT
%K XRD
%K Raman scattering
%K piezo electric ceramics<br>Cr掺杂
%K 0.2PZN-0.8PZT
%K X光衍射
%K 拉曼散射
%K 压电陶瓷
%U http://www.alljournals.cn/get_abstract_url.aspx?pcid=5B3AB970F71A803DEACDC0559115BFCF0A068CD97DD29835&cid=1319827C0C74AAE8D654BEA21B7F54D3&jid=D3B4F771D1A06062008B4D0A2EF05996&aid=E4C84F5F0B37E847CD82BCDE73583EEA&yid=A732AF04DDA03BB3&vid=96C778EE049EE47D&iid=CA4FD0336C81A37A&sid=CB423C9A71560A74&eid=37F9204ABC32265D&journal_id=1001-9014&journal_name=红外与毫米波学报&referenced_num=0&reference_num=7