%0 Journal Article
%T INITIALIZATION PARAMETER AUTO-CHECK ALGORITHM EXECUTION OF INFRARED THIN FILM MONITORING SYSTEM<br>红外光学薄膜监控系统初始化参数自检算法设计
%A HU Min Feng
%A ZHU Fu Rong
%A ZHANG Feng
%A Shan
%A <br>胡民锋
%A 朱福荣
%J 红外与毫米波学报
%D 2001
%I Science Press
%X Initialization parameters used in infrared optical thin film monitoring system, including input coatings, monitoring mode, monitoring wavelength, material coefficients, slice options,etc.,were listed in forms of dialog control. When the user inputs these parameters, the application programme can automatically check these parameters' validity to ensure that the contents the user inputs are correct, thus, it supplies a kind of security mechanism for subsequent automatic control of optical thin film process. The corresponding algorithm was also given in this paper.
%K optical thin film monitoring
%K initialization parameters
%K algorithm design<br>初始化参数
%K 算法设计
%K 红外光学薄膜监控系统
%K 自动监控
%U http://www.alljournals.cn/get_abstract_url.aspx?pcid=5B3AB970F71A803DEACDC0559115BFCF0A068CD97DD29835&cid=1319827C0C74AAE8D654BEA21B7F54D3&jid=D3B4F771D1A06062008B4D0A2EF05996&aid=94F1521269B75B8F&yid=14E7EF987E4155E6&vid=A04140E723CB732E&iid=0B39A22176CE99FB&sid=76B5E24D6EC46B4B&eid=5E25104E99903E8A&journal_id=1001-9014&journal_name=红外与毫米波学报&referenced_num=0&reference_num=2