%0 Journal Article
%T ELECTRICALLY ACTIVE DEFECTS IN HgCdTe AND OPTO-ELECTRONIC PROPER- TIES OF FOCAL PLANE ARRAY BY LASER BEAM INDUCED CURRENT<br>激光束感应电流法研究HgCdTe电活性缺陷和焦平面器件的光电特性
%A MAO Wen
%A Ying
%A SUN Quan
%A CHU Jun
%A Hao
%A <br>茅文英
%A 赵军
%J 红外与毫米波学报
%D 2001
%I Science Press
%X A high resolution and nondestructive optical characterization technique called laser beam induced current (LBIC) was utilized to detect electrically active defects in HgCdTe wafers. It was also used to study the opto electronic properties in photovoltaic detector elements for focal plane array without the requirement of any electrical contacts to individual detector elements. The LBIC was detected in HgCdTe wafers. The periodic distribution of LBIC was observed in photovoltaic detector with P N junction array. The uniformity for the performance of the diodes in an array can then be assessed by examining qualitatively the LBIC image and by analyzing quantitatively the profile of LBIC signal corresponding to individual diodes.
%K infrared focal plane arrays
%K P
%K N junction
%K laser beam induced current<br>红外焦平面器件
%K P－N结
%K 激光束感应电流
%K 光电特性
%K 红外探测器
%U http://www.alljournals.cn/get_abstract_url.aspx?pcid=5B3AB970F71A803DEACDC0559115BFCF0A068CD97DD29835&cid=1319827C0C74AAE8D654BEA21B7F54D3&jid=D3B4F771D1A06062008B4D0A2EF05996&aid=62FE86B18E1BA6E95E90A63C4AC2A7FA&yid=14E7EF987E4155E6&vid=A04140E723CB732E&iid=E158A972A605785F&sid=0F7768518993EDDE&eid=30897FA31CA3354D&journal_id=1001-9014&journal_name=红外与毫米波学报&referenced_num=0&reference_num=2