%0 Journal Article
%T THE ELECTRO OPTIC SAMPLING MEASUREMENT WITH MULTIPLE FREQUENCY PHASE SHIFT SCANNING METHOD<br>倍频移相扫描法电光采样测量
%A Tian Xiaojian
%A Yi Maobin
%A Sun Wei
%A Jia Gang
%A Sun Jianguo
%A <br>田小建
%A 马振昌
%J 红外与毫米波学报
%D 1997
%I Science Press
%X The principle of multiple frequency phase shift scanning method was analyzed. The electro optic sampling system constructed with the multiple frequency phase shift scanning method was introduced. An integrated circuit chip of high speed GaAs dynamic freqnency dividing circuit was measured, and the measured frequency dividing waveform was presented.
%K phase
%K shift scanning
%K electro
%K optic sampling
%K integrated circuit chip<br>移相扫描，电光采样，集成电路芯片
%U http://www.alljournals.cn/get_abstract_url.aspx?pcid=5B3AB970F71A803DEACDC0559115BFCF0A068CD97DD29835&cid=1319827C0C74AAE8D654BEA21B7F54D3&jid=D3B4F771D1A06062008B4D0A2EF05996&aid=76DDD033259936E57218AEB530589B06&yid=5370399DC954B911&vid=7801E6FC5AE9020C&iid=38B194292C032A66&sid=3A0155B37D8FF829&eid=C29816B2656377A7&journal_id=1001-9014&journal_name=红外与毫米波学报&referenced_num=5&reference_num=0