%0 Journal Article
%T GROWTH AND CHARACTERIZATION OF Hg_(1-x)Cd_x Te LPE FILMS<br>液相外延生长Hg_（1－x）Cd_xTe薄膜及其特性分析
%A Li Biao
%A Cheng Xinqiang
%A Chu Junhao
%A Chao Juying
%A Tang Dingyuan
%A <br>李标
%A 陈新强
%A 褚君浩
%A 曹菊英
%A 汤定元
%J 红外与毫米波学报
%D 1995
%I Science Press
%X The liquid phase epitaxy (LPE) growth of Hg1-xCdxTe from Te-rich solution in a vertical dipping reactor system is reported.X-ray double-crystal diffraction and IR transmittance spectra were used for the characterization of the quality of epilayers.It is seen that the Hg vapor pressure,degree of supercooling,cooling rate and annealing condition affect the properties of grown layers.The degree of mismatch and the x-value of epilayer can be derived quantitatively from the X-ray rocking curve,while the longitudinal composition profile of the epilayer is determined from the room temperature infrared transmission.
%K liquid phase epitaxy
%K Hg1-xCdxTe X-ray double-crystal diffraction
%K infrared transmitance spectrum<br>液相外延，Hg1－xCdxTe，X射线双晶衍射，红外透射光谱
%U http://www.alljournals.cn/get_abstract_url.aspx?pcid=5B3AB970F71A803DEACDC0559115BFCF0A068CD97DD29835&cid=1319827C0C74AAE8D654BEA21B7F54D3&jid=D3B4F771D1A06062008B4D0A2EF05996&aid=B63E86935F7E175B86B20B8CC0C67ECC&yid=BBCD5003575B2B5F&vid=F3583C8E78166B9E&iid=38B194292C032A66&journal_id=1001-9014&journal_name=红外与毫米波学报&referenced_num=0&reference_num=0