%0 Journal Article
%T ELECTRO-OPTIC SAMPLING MEASUREMENT OF MICROWAVE SIGNALS USING A SEMICONDUCTOR LASER<br>用半导体激光器超高速电光采样技术测量微波信号
%A Sun Wei
%A Yi Maobin
%A Wang Yianhui Liu Zhongshun
%A Jia Gang
%A Gao Dingsan
%A <br>孙伟
%A 衣茂斌
%J 红外与毫米波学报
%D 1992
%I Science Press
%X 利用半导体激光器作为采样光源的超高速电光采样测试系统(时间分辨率最高可达16.7ps,电压灵敏度为0.26mVHz~(-1/2)).测量了1～5GHz的微波信号和同轴电缆传输线的色散展宽.
%K electro-optic sampling
%K semiconductor lasers
%K microwave signals
%K dispersion extension<br>电光采样
%K 半导体
%K 激光器
%K 微波信号
%U http://www.alljournals.cn/get_abstract_url.aspx?pcid=5B3AB970F71A803DEACDC0559115BFCF0A068CD97DD29835&cid=1319827C0C74AAE8D654BEA21B7F54D3&jid=D3B4F771D1A06062008B4D0A2EF05996&aid=ED4725DB2CEE2CFAEFFE7FC52F32ACEA&yid=F53A2717BDB04D52&vid=708DD6B15D2464E8&iid=CA4FD0336C81A37A&sid=35FC3610259C2B32&eid=656F8C8401D91023&journal_id=1001-9014&journal_name=红外与毫米波学报&referenced_num=2&reference_num=0