%0 Journal Article
%T STRUCTURE DETERMINATION OF INFRARED MATERIAL OF (CdTe-ZnTe)/ZnTe/GaAs (001) SUPERLATTICE BY X-RAY DIFFRACTION<br>超晶格（CdTe－ZnTe）／ZnTe／GaAs（001）红外材料的X射线测定
%A Zhong Fuming
%A Chen Jinyi
%A Zhu Nanchang
%A <br>钟福民
%A 陈京一
%A 朱南昌
%A 李杰
%A 袁诗鑫
%J 红外与毫米波学报
%D 1994
%I Science Press
%X The structure perfection of infrared materials of (CdTes-ZnTe)/ZnTe superlattices grown on GaAs (001) by atomic layer epitaxy was investigated by X-ray diffraction (XRD), combined with the analysis of kinematical X-ray diffraction theory and computer simulation of dynamical X-ray diffraction theory. The structure parameters were obtained for the simple and the complex structures of superlattices.
%K X-ray diffraction
%K strained-layer superlattice
%K computer simulation
%K structure parameter<br>X射线衍射，应变超晶格，计算机模拟，结构参数
%U http://www.alljournals.cn/get_abstract_url.aspx?pcid=5B3AB970F71A803DEACDC0559115BFCF0A068CD97DD29835&cid=1319827C0C74AAE8D654BEA21B7F54D3&jid=D3B4F771D1A06062008B4D0A2EF05996&aid=832E8141FA3097AEE29B4D7C62E6F776&yid=3EBE383EEA0A6494&vid=FC0714F8D2EB605D&iid=CA4FD0336C81A37A&journal_id=1001-9014&journal_name=红外与毫米波学报&referenced_num=0&reference_num=0