%0 Journal Article
%T Low Power Testing¡ªWhat Can Commercial Design-for-Test Tools Provide?
%A Xijiang Lin
%J Journal of Low Power Electronics and Applications
%D 2011
%I MDPI AG
%R 10.3390/jlpea1030357
%X Minimizing power consumption during functional operation and during manufacturing tests has become one of the dominant requirements for the semiconductor designs in the past decade. From commercial design-for-test (DFT) tools¡¯ point of view, this paper describes how DFT tools can help to achieve comprehensive testing of low power designs and reduce test power consumption during test application.
%K low-power design
%K low-power testing
%K scan testing
%K test compression
%K DFT tools
%U http://www.mdpi.com/2079-9268/1/3/357