%0 Journal Article
%T Electron Microscope Speckle Photography Technique<br>电子显微镜散斑照相技术
%A LIU Zhan-wei
%A WU Ning-ning
%A XIE Hui-min
%A DAI Fu-long
%A <br>刘战伟
%A 吴宁宁
%A 谢惠民
%A 戴福隆
%J 光子学报
%D 2009
%I 
%X A novel artificial sub-micron or nanometer speckle fabricating technique was proposed by taking advantage of sub-micron or nanometer particles.In the technique,sub-micron or nanometer particles were adhered to an object surface by using ultrasonic dispersing technique.The particles on the object surface can be regarded as sub-micron or nanometer speckle by using a Scanning Electronic Microscope (SEM) at a special magnification.And,an Electron Microscope Speckle Photography (EMSP) method was developed to measure in-plane submicron or nanometer deformation of the object coated with the artificial sub-micron or nanometer speckles.The principle of artificial sub-micron or nanometer speckle fabricating technique and the EMSP method were discussed in detail.The experimental results verified that the artificial sub-micron or nanometer speckle fabricating technique and EMSP method is feasible.
%K Experimental mechanics
%K Electron microscope speckle photography
%K Sub-micron or nanometer speckle
%K Ultrasonic dispersing technique<br>实验力学
%K 电子显微镜散斑照相技术
%K 亚微米/纳米散斑
%K 超声波分散技术
%U http://www.alljournals.cn/get_abstract_url.aspx?pcid=6E709DC38FA1D09A4B578DD0906875B5B44D4D294832BB8E&cid=47EA7CFDDEBB28E0&jid=9F6139E34DAA109F9C104697BF49FC39&aid=3335CDF8CF308EEE1E44D86B274FC410&yid=DE12191FBD62783C&vid=16D8618C6164A3ED&iid=CA4FD0336C81A37A&sid=0401E2DB1F51F8DE&eid=68D88C2FCF9C3098&journal_id=1004-4213&journal_name=光子学报&referenced_num=0&reference_num=13