%0 Journal Article
%T Micro-displacement Measuring Instrument with Semi-conductor Laser Fabry-Perot Interference Wave Length<br>半导体激光Fabry-Perot干涉波长的微位移测量仪
%A 杨秀芳
%A 王小明
%A 刘月明
%A 郭彦珍
%J 光子学报
%D 2005
%I 
%X A kind of measuring instrument based on F-P interference wave length is designed.The measuring instrument use double interference cavities.One of interference cavities is reference cavity,the other is measuring cavity.One reflect surface of reference cavity is installed with piezoelectric ceramics,One reflect surface of measuring cavity is erected with an object to be measured.When the central wavelengths in reference Fabry-Perot interference and in measuring Fabry-Perot interference are overlapped,there are the maximum light signal outputs. Based on the relationship between the transmission spectrum central wave length and its interference cavity length, this measuring instrument can be used to realize the real time measurement of Nano-grade micro-displacement.Using simi-conductor laser as the light resource can obtain the required wavelength values and its variation scopes.It can be seen from the measured results that the measured error is not over 1.5 nm. Such a precision can satisfy the precision requirements as in the fields of precision mechanical processing, photoelectronic processing and Nano-grade measuring technology.
%K Fabry-Perot interferometer
%K Micro-distance measuring instrument
%K Laser diode
%K Transmission spectrum<br>Fabry—Perot干涉仪
%K 微位移测量仪
%K 半导体激光
%K 透射光谱
%U http://www.alljournals.cn/get_abstract_url.aspx?pcid=6E709DC38FA1D09A4B578DD0906875B5B44D4D294832BB8E&cid=47EA7CFDDEBB28E0&jid=9F6139E34DAA109F9C104697BF49FC39&aid=CDDE6DD09D2377F5&yid=2DD7160C83D0ACED&vid=339D79302DF62549&iid=B31275AF3241DB2D&sid=DE4E739E935BD9A7&eid=C45B504FED793340&journal_id=1004-4213&journal_name=光子学报&referenced_num=0&reference_num=8