%0 Journal Article
%T The Effect of CCD on High Spatial Resolution Interferometric Optical Test
CCD对高空间分辨率波前干涉检测的影响
%A Fine Optical Engineering Research Center
%A Chengdu
%A
徐建程
%A 邓燕
%A 柴立群
%A 许乔
%A 石崎凯
%J 光子学报
%D 2006
%I
%X It is deduced and verified by experiment that the relation between optical intensity and incidence wavefront is nearly linear in unit cell size. Therefore, the formula of PSD sampled by CCD is obtained. According to the formula, many factors affecting the system transfer function in the CCD capture system are simulated and conformed by experiment, such as the maximum spatial frequency of incidence wavefront, the PSD of incidence wavefront in high spatial frequency, the fill factor and the exposure time of CCD. Then some useful qualitative conclusions between these factors and the system transfer function are obtained. Furthermore, the qualitative relation between the exposure time of CCD and repeatability of high spatial resolution interferometric optical test is conformed by experiment.
%K Interferometry
%K High spatial frequency
%K Power spectral density (PSD)
%K System transfer function (STF)
%K CCD
干涉检测
%K 系统传递函数
%K 功率谱密度(PSD)
%K 高空间分辨率
%K CCD
%U http://www.alljournals.cn/get_abstract_url.aspx?pcid=6E709DC38FA1D09A4B578DD0906875B5B44D4D294832BB8E&cid=47EA7CFDDEBB28E0&jid=9F6139E34DAA109F9C104697BF49FC39&aid=6309D3A977643A4A&yid=37904DC365DD7266&vid=6209D9E8050195F5&iid=94C357A881DFC066&sid=8225A9F184D4F1CA&eid=6920A1020E13BE87&journal_id=1004-4213&journal_name=光子学报&referenced_num=2&reference_num=10