%0 Journal Article
%T Measurement of the Photon Emission Characteristic of Silicon Avalanche Photodiode<br>硅雪崩二极管光子辐射特性的实验研究
%A State Key Laboratory of Quantum Optics
%A Quantum Optics Devices
%A College of Physics
%A Electronics Engineering
%A Shanxi Univ
%A Taiyuan
%A <br>邵军虎
%A 黄涛
%A 王晓波
%A 赵延霆
%A 肖连团
%A 贾锁堂
%J 光子学报
%D 2005
%I 
%X The temporal and photo-statistic characteristics of silicon APD photon emission were got experimentally by measuring its photon statistics under breakdown condition. Compared with corresponding Poisson distribution and thermal field photon statistic distribution, the photo-statistic distribution of APD photon emission with 10 ms bin time was found to be Super-Poisson distribution. The fluorescence spectrum of the APD photon emission was also achieved in experiment.
%K Avalanche Photodiode
%K Photon emission
%K Photo-statistics spectrum<br>雪崩光电二极管
%K 光子辐射
%K 光子统计
%K 光谱
%U http://www.alljournals.cn/get_abstract_url.aspx?pcid=6E709DC38FA1D09A4B578DD0906875B5B44D4D294832BB8E&cid=47EA7CFDDEBB28E0&jid=9F6139E34DAA109F9C104697BF49FC39&aid=6859C1DD098EE208&yid=2DD7160C83D0ACED&vid=339D79302DF62549&iid=38B194292C032A66&sid=0954045FA0C6885F&eid=35E8A259891FB32F&journal_id=1004-4213&journal_name=光子学报&referenced_num=9&reference_num=17