%0 Journal Article
%T Multiple superimposed tomography of probability on second electrical field<br>二次电流场多次叠加概率成像
%A YAN Yong-Li
%A ZHAO Yong-Gui
%A CHEN Ben-Chi
%A CHEN Yun
%A MA Xiao-Bing
%A KONG Xiang-Ru
%A <br>闫永利
%A 赵永贵
%A 陈本池
%A 陈谮
%A 马晓冰
%A 孔祥儒
%J 地球物理学报
%D 2008
%I 
%X Based on integral formula,discrete second electrical field is expressed as a sum of elementary contributions coming from charges accumulated on the surfaces of resistivity discontinuity.The electrical field of a positive unit point charge is introduced as space domain scanning(SDS)function,and charge occurrence probability(COP)is defined as the cross-correlation of the second electrical field with the SDS function.In order to analyze COP anomalies,COP function is normalized.To test the effectiveness of probability tomography of second electrical field,we use finite element algorithm to synthesize second electrical field for several models,and implement multiple superimposed tomography of probability.The results are quite satisfactory.
%K Electrical resistivity tomography
%K Second electrical field
%K Probability tomography
%K Space domain scanning(SDS)function
%K Normalized charge occurrence probability(NCOP)function<br>电阻率层析成像
%K 二次电流场
%K 概率成像
%K 空间扫描函数
%K 规范的积累电荷出现的概率函数
%U http://www.alljournals.cn/get_abstract_url.aspx?pcid=E62459D214FD64A3C8082E4ED1ABABED5711027BBBDDD35B&cid=1E44AE713D8A6DE0&jid=14DC41C59CBF6770055A7D610D53AE46&aid=94AE7C2721625E1BFE9585A28360BB2F&yid=67289AFF6305E306&vid=987EDA49D8A7A635&iid=94C357A881DFC066&sid=E2EDBBF9B5CDD657&eid=617DEAEB2884AFC7&journal_id=0001-5733&journal_name=地球物理学报&referenced_num=3&reference_num=28