%0 Journal Article
%T ELECTRIC EFFECTS OF La AT THE Si/SiO2 INTERFACE<br>La在Si/SiO2界面的电效应
%A Li Siyuan
%A Zhang Tongjun
%A Li Shousong
%A Wang Yuzhen
%A <br>李思渊
%A 张同军
%A 李寿嵩
%A 王毓珍
%J 电子与信息学报
%D 1985
%I 
%X The negative electric effects of La metai at the Si/SiO2 interface and the heat treatment behaviour of these effects are studied experimentally. In addition, the results of electron spectroscopy analysis of the La-doped interface are also presented.
%U http://www.alljournals.cn/get_abstract_url.aspx?pcid=5B3AB970F71A803DEACDC0559115BFCF0A068CD97DD29835&cid=1319827C0C74AAE8D654BEA21B7F54D3&jid=EFC0377B03BD8D0EF4BBB548AC5F739A&aid=11D21FA0A7E91DA4FBF1B7FD4C23E5AE&yid=74E41645C164CD61&vid=DF92D298D3FF1E6E&iid=38B194292C032A66&sid=9CA95D22FC1D537C&eid=C812B90E96151014&journal_id=1009-5896&journal_name=电子与信息学报&referenced_num=0&reference_num=10