%0 Journal Article
%T MULTISTATE REPLECTOMETER<br>多状态反射计技术
%A Xu Jiadong
%A <br>许家栋
%J 电子与信息学报
%D 1986
%I 
%X A detail discussion on multistate technique and a comparison of it with the multiport technique are given. The relation between output powers and reflection of the device under test is shown. An experjmental millimeterwave multistate reflectometer is given and its measuring nesults are satisfactory.
%U http://www.alljournals.cn/get_abstract_url.aspx?pcid=5B3AB970F71A803DEACDC0559115BFCF0A068CD97DD29835&cid=1319827C0C74AAE8D654BEA21B7F54D3&jid=EFC0377B03BD8D0EF4BBB548AC5F739A&aid=A3C1B726BC928960&yid=4E65715CCF57055A&vid=5D311CA918CA9A03&iid=CA4FD0336C81A37A&sid=16D8618C6164A3ED&eid=1AE5323881A5ECDC&journal_id=1009-5896&journal_name=电子与信息学报&referenced_num=0&reference_num=6