%0 Journal Article
%T ANALYSIS OF THE SURFACE PHOTO-VOLTAGE METHOD MEASUREMENTS<br>同型外延材料表面光伏法测试的分析
%A Zhang Xiumiao
%A He Guogen
%A Song Jiatao
%A <br>张秀淼
%A 贺国根
%A 宋加涛
%J 电子与信息学报
%D 1993
%I 
%X The applicability of the assumption, "the surface photo-voltage is a monotonic function of the surface excess minority carrier density", to epitaxial material is studied by numerical analysis method. It is found that this assumption is unreasonable for epitaxial material in general. Therefore when the minority carrier diffusion length in epitaxial material is measured by the equal-surface-photo-voltage method, the surface excess minority carrier density should not be considered as a constant. In this paper, the condition under which the surface excess minority carrier density may be treated as a constant is also analysed.
%K Epitaxial material
%K Diffusion length
%K Surface photo-voltage<br>外延材料
%K 扩散长度
%K 表面光伏法
%U http://www.alljournals.cn/get_abstract_url.aspx?pcid=5B3AB970F71A803DEACDC0559115BFCF0A068CD97DD29835&cid=1319827C0C74AAE8D654BEA21B7F54D3&jid=EFC0377B03BD8D0EF4BBB548AC5F739A&aid=9AB303BEDD8539A4&yid=D418FDC97F7C2EBA&vid=23CCDDCD68FFCC2F&iid=CA4FD0336C81A37A&sid=89F76E117E9BDB76&eid=D767283A3B658885&journal_id=1009-5896&journal_name=电子与信息学报&referenced_num=0&reference_num=10