%0 Journal Article
%T Z-scan analysis of high-order nonlinear refraction effect induced by using elliptic Gaussian beam<br>
%A Guo Shi-Fang
%A Tian Qiang
%A <br>
%J 中国物理 B
%D 2010
%I 
%X The irradiance of an elliptic Gaussian beam that is high enough to excite high-order nonlinear refraction effect is used to calculate the normalized on-axis transmittance function in the z-scan technique by introducing complex beam parameters which make the calculation simpler. The transmittance formula is applied to the first-, first two-, and first three-order nonlinearities. Numerical evaluation shows that the symmetry no longer holds when using an elliptic Gaussian beam instead of a circular Gaussian beam. A distortion is observed in the central part of the curve, which decreases as ellipticity increases. Moreover, the variation of the normalized peak-valley difference decreases as ellipticity decreases.
%K z-scan
%K elliptic Gaussian beam
%K complex beam parameter
%K high order<br>
%U http://www.alljournals.cn/get_abstract_url.aspx?pcid=6E709DC38FA1D09A4B578DD0906875B5B44D4D294832BB8E&cid=47EA7CFDDEBB28E0&jid=CD8D6A6897B9334F09D8D1648C376FB4&aid=782E8A0961838AD9E00045E553FBA1AE&yid=140ECF96957D60B2&vid=2A8D03AD8076A2E3&iid=B31275AF3241DB2D&journal_id=1009-1963&journal_name=中国物理&referenced_num=0&reference_num=48