%0 Journal Article
%T Four-probe scanning tunnelling microscope with atomic resolution for electrical and electro-optical property measurements of nanosystems<br>用于纳米体系电学及电光性质测量的原子分辨的四探针扫描隧道显微镜
%A Lin Xiao
%A He Xiao-Bo
%A Lu Jun-Ling
%A Gao Li
%A Huan Qing
%A Shi Dong-Xia
%A Gao Hong-Jun
%A <br>林晓
%A 贺晓波
%A 路军岭
%A 高利
%A 郇庆
%A 时东霞
%A 高鸿钧
%J 中国物理 B
%D 2005
%I 
%X We demonstrate a special four-probe scanning tunnelling microscope (STM) system in ultrahigh vacuum (UHV), which can provide coarse positioning for every probe independently with the help of scanning electron microscope (SEM) and fine positioning down to nanometre using the STM technology. The system allows conductivity measurement by means of a four-point probe method, which can draw out more accurate electron transport characteristics in nanostructures, and provides easy manipulation of low dimension materials. All measurements can be performed in variable temperature (from 30K to 500K), magnetic field (from 0 to 0.1T), and different gas environments. Simultaneously, the cathodoluminescence (CL) spectrum can be achieved through an optical subsystem. Test measurements using some nanowire samples show that this system is a powerful tool in exploring electron transport characteristics and spectra in nanoscale physics.
%K four-probe STM
%K nanodevice
%K electrical measurement
%K manipulation
%K CL<br>四探针扫描隧道显微镜，纳米器件，电学测量，操纵，阴极发光谱
%U http://www.alljournals.cn/get_abstract_url.aspx?pcid=6E709DC38FA1D09A4B578DD0906875B5B44D4D294832BB8E&cid=47EA7CFDDEBB28E0&jid=CD8D6A6897B9334F09D8D1648C376FB4&aid=D67B58EB7012203D29C977833C7F7AAE&yid=2DD7160C83D0ACED&vid=F3583C8E78166B9E&iid=5D311CA918CA9A03&sid=69E0A22DA7775B50&eid=815F249353800F81&journal_id=1009-1963&journal_name=中国物理&referenced_num=0&reference_num=18