%0 Journal Article
%T ELECTROREFLECTANCE SPECTRA OF GexSi1-x/Si STRAINED LAYER MULTIPLE-QUANTUM WELLS<br>
%A PAN SHI-HONG
%A HUANG SHUO
%A WANG ZHONG-HE
%A CHEN WEI
%A ZHANG CUN-ZHOU
%A SHENG CHI
%A WANG XUN
%A <br>
%J 中国物理 B
%D 1994
%I 
%U http://www.alljournals.cn/get_abstract_url.aspx?pcid=6E709DC38FA1D09A4B578DD0906875B5B44D4D294832BB8E&cid=47EA7CFDDEBB28E0&jid=CD8D6A6897B9334F09D8D1648C376FB4&aid=BB2DE7556608300AFE6B6AE4406E2364&yid=3EBE383EEA0A6494&vid=38B194292C032A66&iid=38B194292C032A66&sid=CEC789B3C68C3BB3&eid=F8035C8B7D8A4264&journal_id=1009-1963&journal_name=中国物理&referenced_num=0&reference_num=0