%0 Journal Article
%T OSCILLATORY INTERLAYER COUPLING WITH Cu AND Zr UNDERLAYER THICKNESS FOR Co/Cu MULTILAYERS<br>
%A Zhao Tong-yun
%A Shan Zheng-sheng
%A Shen Bao-gen
%A Zhao Jian-gao
%A D J Sellmyer
%A <br>
%J 中国物理 B
%D 1998
%I 
%X Oscillatory behavior (with a period of about 9 nm) of antiferromagnetic coupling with the thicknesses of Cu and Zr underlayers is reported for sputtered Co(1 nm)/Cu(2.3 nm) multilayers. The related oscillation of magnetoresistance is also observed. Based on the analysis of X-ray diffraction patterns, the variation of crystallographic orientation and modulation period is proved not responsible to the phenomenon. But the underlayer strongly affects the growth orientation of multilayer.
%U http://www.alljournals.cn/get_abstract_url.aspx?pcid=6E709DC38FA1D09A4B578DD0906875B5B44D4D294832BB8E&cid=47EA7CFDDEBB28E0&jid=CD8D6A6897B9334F09D8D1648C376FB4&aid=4E2D4B6B3C415A0F3B5F1757A23E67E5&yid=8CAA3A429E3EA654&vid=DF92D298D3FF1E6E&iid=5D311CA918CA9A03&sid=9E7C0CB25117E09B&eid=7FAAB0292FA0D5D0&journal_id=1009-1963&journal_name=中国物理&referenced_num=0&reference_num=0