%0 Journal Article
%T Microanalysis on the Hydrogen Ion Irradiated 50 wt pct TiC-C Films
%A Hui JIANG
%A Yaoguang LIU
%A Ningkang HUANG
%A <br>Hui JIANG
%A Yaoguang LIU and Ningkang HUANG Key Laboratory for Radiation Physics and Technology of Education Ministry of China
%A Institute of Nuclear Science and Technology
%A Sichuan University
%A Chengdu
%A China Institute of Nuclear Physics and Chemistry
%A China Academy of Engineering Physics
%A Mianyang
%A China
%J 材料科学技术学报
%D 2007
%I 
%X The 50 wt pct TiC-C films were prepared on stainless steel substrates by using a technique of ion beam mixing.These films were irradiated by hydrogen ion beam with a dose of 1×1018 ions/cm2 and an energy of 5 keV.Microanalysis of X-ray photoelectron spectroscopy (XPS) and secondary ion mass spectroscopy (SIMS) were used to analyze the films before and after hydrogen ion irradiation and to study the mechanism of hydrogen resistance.
%K Titanium carbide
%K Hydrogen ion irradiation
%K Microanalysis<br>碳化钛
%K 薄膜
%K 沉淀
%K 氢离子辐射
%K XPS
%K 微量分析
%U http://www.alljournals.cn/get_abstract_url.aspx?pcid=5B3AB970F71A803DEACDC0559115BFCF0A068CD97DD29835&cid=84529CA2B2E519AC&jid=324DC3CAB22330DB19158AE0A9B7BFA5&aid=2BC8172ACB965000&yid=A732AF04DDA03BB3&vid=EA389574707BDED3&iid=CA4FD0336C81A37A&sid=B344543C2864D684&eid=B47A0E731AF43EB2&journal_id=1005-0302&journal_name=材料科学技术学报&referenced_num=0&reference_num=17