%0 Journal Article
%T Preparation and Characterization of CeO2/YSZ/CeO2 Buffer Layers for YBCO Coated Conductors
%A Jie XIONG
%A Yin CHEN
%A Yang QIU
%A Bowan TAO
%A Wenfeng QIN
%A Xumei CUI
%A Yanrong LI
%A <br>Jie
%A XIONG
%A Yin
%A CHEN
%A Yang
%A QIU
%A Bowan
%A TAO
%A Wenfeng
%A QIN
%A Xumei
%A CUI
%A Yanrong
%A LI
%J 材料科学技术学报
%D 2007
%I 
%X CeO2 seed layer was deposited on rolling-assisted biaxially textured metal substrates by direct-current (DC) magnetron reactive sputtering. The effect of deposition temperature on epitaxial orientation of CeO2 thin films was examined. High quality CeO2 layers were achieved at deposition temperature from 750℃ to 850℃.Subsequently yttria-stabilized zirconia (YSZ) and CeO2 films were deposited to complete the buffer layer structure via the same process. The best samples exhibited a highly biaxial texture, as indicated by FWHM (full width half maximum) values in the range of 4°-5°, and 2°-4° for in-plane and out-of-plane orientations,respectively. Secondary ion mass spectrometer analysis confirmed the effective prevention of buffer layer against Ni and W metal interdiffusion. Atomic force microscope observations revealed a smooth, dense and crack-free surface morphology, which provided themselves as the good buffer structure to the YBa2Cu3O7-δ(YBCO) coated conductors.
%K Buffer
%K Direct-current magnetron reactive sputtering
%K Coated conductors
%K RABiTS<br>缓冲器
%K 直接电流磁控管电抗性溅射
%K 涂层导体
%K 在非织构金属基底上生长缓冲层和超导层
%U http://www.alljournals.cn/get_abstract_url.aspx?pcid=5B3AB970F71A803DEACDC0559115BFCF0A068CD97DD29835&cid=84529CA2B2E519AC&jid=324DC3CAB22330DB19158AE0A9B7BFA5&aid=2E2DC3A1BA32120B&yid=A732AF04DDA03BB3&vid=EA389574707BDED3&iid=E158A972A605785F&sid=D0E8F9CBDBE0070C&eid=E0172F1A638CE984&journal_id=1005-0302&journal_name=材料科学技术学报&referenced_num=0&reference_num=10