%0 Journal Article
%T Relaxation Phenomenon of Te_(10)Ge_(10)Se_(80-x)Sb_x Bulk Glassy System
%A AElshafie
%A <br>
%J 材料科学技术学报
%D 1998
%I 
%X The dielectric constant and dielectric loss of Te10Ge10Se80-xSbx (x=3, 6, 12 at. pct) chalcogenide alloys were measured in the temperature range (300 to 453 K) and the frequency range (100 Hz to 100 kHz). The real dielectric constant ∈′and imaginary dielectric constant ∈" show a decrease with increasing frequency and an increase with increasing temperature. All samples display dielectric dispersion. Both ∈′ and ∈" show a Debye relaxation type. The enthalpy activation energy ΔH and activation energy WH were calculated. Cole-Cole diagram consists of an arc of semicircle shifted from the origin and its center below the real axis at high frequency
%U http://www.alljournals.cn/get_abstract_url.aspx?pcid=5B3AB970F71A803DEACDC0559115BFCF0A068CD97DD29835&cid=84529CA2B2E519AC&jid=324DC3CAB22330DB19158AE0A9B7BFA5&aid=F1F1D598DC8D7862&yid=8CAA3A429E3EA654&vid=F3583C8E78166B9E&iid=B31275AF3241DB2D&sid=B99A53AADE50D922&eid=F204392B3B11C3BD&journal_id=1005-0302&journal_name=材料科学技术学报&referenced_num=0&reference_num=0