%0 Journal Article
%T DEVELOPMENT OF HIGH RESOLUTION QUANTITATIVE ELECTRON MICROSCOPY AND ITS APPLICATIONS TO MATERIAL SCIENCE<br>高分辨率定量电子显微学的发展及其在材料科学中的应用
%A LI Douxing
%A <br>李斗星
%J 材料研究学报
%D 1998
%I 
%X This article summarizes the current and future trends of the development of electron microscope,related technique and high resolution quantitative electron microscopy The importance of the studies of structures and defects in materials by combining direct observation at atomic scale and computer simulation, and the fundamental effects on experimental results measured by quantitative high resolution electron microscopy are discussed, such as three-fold astigmatism, coma and thin-foil geometries.
%K QHREM
%K QCBED
%K three-fold astigmatism
%K coma
%K direct observation at atomic scale and simulation<br>定量
%K 高分辨
%K 电子显微学
%K 原子尺度
%K 材料科学
%U http://www.alljournals.cn/get_abstract_url.aspx?pcid=5B3AB970F71A803DEACDC0559115BFCF0A068CD97DD29835&cid=84529CA2B2E519AC&jid=C101C4C04993B4D94FCD8446E6CBEB3B&aid=8985DA0DB5E8F21A&yid=8CAA3A429E3EA654&vid=59906B3B2830C2C5&iid=94C357A881DFC066&sid=78BF76CF5B7CB0F2&eid=1A033C02510EFBE6&journal_id=1005-3093&journal_name=材料研究学报&referenced_num=2&reference_num=26