%0 Journal Article
%T X-ray Powder Diffraction Pattern of Bi_4(SiO_4)_3
%A Hongchao LIU
%A Changlin KUO
%A <br>
%J 材料科学技术学报
%D 1997
%I 
%X In cooperation with figure-of-merits the Rietveld analysis can appraise both angular and intensity data of powder diffraction. In this work, X-ray diffraction pattern of Bi4(SiO4)3 was redetermined with intensity figure-of-merits, which qualify agreement between observed and calculated relative intensities. F30 is 158.90 (0.0059, 32), intensity figure of merit Rint is 8.7, I20(17), 8.0. The values of figure-of-merits show that the data of JCPDS cards are distorted. Both the experimental and calculated peak positions and heights are listed in detail.
%U http://www.alljournals.cn/get_abstract_url.aspx?pcid=5B3AB970F71A803DEACDC0559115BFCF0A068CD97DD29835&cid=84529CA2B2E519AC&jid=324DC3CAB22330DB19158AE0A9B7BFA5&aid=255BBF3A95C886F1&yid=5370399DC954B911&vid=FC0714F8D2EB605D&iid=0B39A22176CE99FB&sid=769BD58726D66E7D&eid=856C2E13D1000DB7&journal_id=1005-0302&journal_name=材料科学技术学报&referenced_num=0&reference_num=0