%0 Journal Article
%T THE STRUCTURE AND PROPERTIES OF AMORPHOUS Ge/SiO_2 SUPERLATTICES<br>非晶态Ge／SiO2超晶格结构与特性
%A ZHANG Xinwang
%A CHEN Guanghua
%A <br>张兴旺
%A 陈光华
%J 材料研究学报
%D 1998
%I 
%X The amorphous Ge/SiO2 superlattices have been prepared by rf sputtering with poIycrystalline Ge and quata targets in Ar ambient. Small angle X-ray diffraction measurement was carried to invedigate the structure of the samples, the results indicate the abrupt intedece and highly homogeneous layered structure of the superlattices. The optical band-gap of the superlattices were determined by infrared transmission and reflection spectra, the blue shift of about 0.3eV of optical band-gap was found when the width of Ge potential well decrease from 0.38nm to 0.12nm.
%K 超晶格
%K 射频溅射
%K 非晶
%K 锗
%K 二氧化硅
%K 光学特性
%U http://www.alljournals.cn/get_abstract_url.aspx?pcid=5B3AB970F71A803DEACDC0559115BFCF0A068CD97DD29835&cid=84529CA2B2E519AC&jid=C101C4C04993B4D94FCD8446E6CBEB3B&aid=0378B708624353958B62A0927D3CFC13&yid=8CAA3A429E3EA654&vid=59906B3B2830C2C5&iid=94C357A881DFC066&sid=D8AE57480552698F&eid=C4BBAD7A2DCC89BC&journal_id=1005-3093&journal_name=材料研究学报&referenced_num=0&reference_num=2