%0 Journal Article
%T KLn Dielectronic Recombination Process of B- Through He-like Cu Ions
%A GAO Ying-Hui
%A ZHANG Xue-Mei
%A NG Fan-Chang
%A CHEN Wen-Dong
%A CHEN Chong-Yang
%A ZOU Ya-Ming
%A <br>高迎辉
%A 张雪梅
%A 孟凡昌
%A 陈卫东
%A 陈重阳
%A 邹亚明
%J 中国物理快报
%D 2008
%I 
%X The KLn dielectronic recombination processes of trapped highly charged B-like through He-like Cu ions are studied theoretically, and the theoretical results are used to analyse our previous experimental data at Heidelberg electron beam ion trap (EBIT). The theoretical resonant positions agree with the experimental resonant positions to a precision of 0.4%, in comparison with the resonant positions of those highest peaks between theory and experiment. The experimental spectra are then fitted using a formula with the theoretical resonant energies and strengths, the result shows good overall agreement between theory and experiment over a wide electron energy range. The distribution of highly charged states is obtained from the fitting parameters.
%K 34
%K 80
%K Lx<br>重组过程
%K 铜离子
%K 电子放射
%K 物理学
%U http://www.alljournals.cn/get_abstract_url.aspx?pcid=6E709DC38FA1D09A4B578DD0906875B5B44D4D294832BB8E&cid=47EA7CFDDEBB28E0&jid=E27DA92E19FE279A273627875A70D74D&aid=901A3E583A2C7E760EAB11A4B5DAA135&yid=67289AFF6305E306&vid=C5154311167311FE&iid=38B194292C032A66&sid=8587C7CAA7A3D0DB&eid=3C5A0072CBF0FE42&journal_id=0256-307X&journal_name=中国物理快报&referenced_num=0&reference_num=11