%0 Journal Article
%T Near-Field Characterization of Optical Micro/Nanofibres
%A MA Zhe
%A WANG Shan-Shan
%A YANG Qing
%A TONG Li-Min
%A <br>马哲
%A 王姗姗
%A 杨青
%A 童利民
%J 中国物理快报
%D 2007
%I 
%X Near-field scanning optical microscopy is used to investigate the waveguiding properties of optical micro/nanofibres (MNFs) by means of detecting optical power carried by evanescent waves. Taper drawn silica and tellurite MNFs, supported on low-index substrates, are used to guide a 532-nm-wavelength light beam for the test. Modification of the single-mode condition of the MNF in the presence of a substrate is observed. Spatial modulation of the longitudinal field intensity (with a 195-nm period) near the output end of a 760-nm-diameter silica MNF is well resolved. Energy exchange through evanescent coupling between two parallel MNFs is also investigated.
%K 87
%K 64
%K Xx
%K 42
%K 79
%K Gn
%K 78
%K 67
%K -n
%K 81
%K 07
%K -b<br>纳米纤维
%K 光纤维
%K 材料学
%K 光学
%U http://www.alljournals.cn/get_abstract_url.aspx?pcid=6E709DC38FA1D09A4B578DD0906875B5B44D4D294832BB8E&cid=47EA7CFDDEBB28E0&jid=E27DA92E19FE279A273627875A70D74D&aid=9BF1E5DC433F0E4D4E28BA5FFD7F0FF3&yid=A732AF04DDA03BB3&vid=B91E8C6D6FE990DB&iid=F3090AE9B60B7ED1&sid=6F0D1488BDB31450&eid=FAEB341CF9D0C324&journal_id=0256-307X&journal_name=中国物理快报&referenced_num=0&reference_num=0