%0 Journal Article
%T THE STUDY OF NANOMETER--DEFORMATION WITH THE SCANNING TUNNELING MICROSCOPE<br>纳米级变形的扫描隧道显微镜测量研究
%A Xie Hui
%A min
%A Dai Fulong Wang Huan
%A <br>谢惠民
%A 戴福隆
%A 王欢
%A 杨海强
%A 高聚宁
%A 庞世瑾
%J 力学学报
%D 1997
%I 
%X By using the scanning tunneling microscope, a new method was put forw ard for measuring the nanometer-deformation with the atom structure. This measuring principle was used to measure the residual deformations of the irradiated single crystal graphite (HOPG) and the Si(111)7×7 surface after atom manipulation. The experimental results verify the present nanometer grid method for measuring nonometer-deformation.
%K scanning tunneling microscope
%K grid method
%K nanometer-deformation<br>扫描隧道显微镜
%K 网格法
%K 纳观变形
%K 纳米级
%U http://www.alljournals.cn/get_abstract_url.aspx?pcid=6E709DC38FA1D09A4B578DD0906875B5B44D4D294832BB8E&cid=5D344E2AD54D14F8&jid=4100DA4A1A3BA1B0CE5AD99AE1DFB420&aid=AE6D6FBC5E5081AC4671A4F915689893&yid=5370399DC954B911&vid=771469D9D58C34FF&iid=38B194292C032A66&sid=2E01F39B6CBD53DE&eid=B66C5792F4740920&journal_id=0459-1879&journal_name=力学学报&referenced_num=0&reference_num=3