%0 Journal Article
%T Electro-Optical Effect Measurement of Thin-Film Material Using PM Fiber Mach-Zehnder Interferometer<br>利用保偏光纤马赫-曾德（MZ）干涉仪测量薄膜材料电光系数
%A Tu Xiaoguang
%A Zhao Lei
%A Chen Ping
%A Chen Shaowu
%A Zuo Yuhu
%A Yu Jinzhong
%A Wang Qiming
%A <br>屠晓光
%A 赵雷
%A 陈平
%A 陈少武
%A 左玉华
%A 余金中
%A 王启明
%J 半导体学报
%D 2007
%I 
%X A polarization-maintaining (PM) fiber Mach-Zehnder (MZ) interferometer has been established to measure the EO effect of very thin film materials with optical anisotropy.Unlike a common MZ interferometer,all the components are connected via polarization-maintaining fibers.At the same time,a polarized DFB laser with a maximum power output of 10mW is adopted as the light source to induce a large extinction ratio.Here,we take it to determine the electro-optical coefficients of a very thin superlattice structure with GaAs,KTP,and GaN as comparative samples.The measured EO coefficients show good comparability with the others.
%K electro-optic effect
%K polarization-maintaining fiber
%K Mach-Zehnder interferometer<br>电光效应
%K 保偏光纤
%K MZ干涉仪
%K electro-optic
%K effect
%K polarization-maintaining
%K fiber
%K Mach-Zehnder
%K interferometer
%U http://www.alljournals.cn/get_abstract_url.aspx?pcid=5B3AB970F71A803DEACDC0559115BFCF0A068CD97DD29835&cid=1319827C0C74AAE8D654BEA21B7F54D3&jid=025C8057C4D37C4BA0041DC7DE7C758F&aid=146626F3A8FD9488&yid=A732AF04DDA03BB3&vid=D3E34374A0D77D7F&iid=DF92D298D3FF1E6E&sid=85873A559EE29055&eid=7AD2D1CE7CD34BB7&journal_id=1674-4926&journal_name=半导体学报&referenced_num=0&reference_num=11