%0 Journal Article
%T Stochastic Analysis of Interconnect Delay in the Presence of Process Variations<br>基于工艺参数扰动的随机互连线时延分析
%A Li Xin
%A Janet M Wang
%A Tang Weiqing
%A Wu Huizhong
%A <br>李鑫
%A Janet M. Wang
%A 唐卫清
%A 吴慧中
%J 半导体学报
%D 2008
%I 
%X Process variations can reduce the accuracy in estimation of interconnect performance.This work presents a process variation based stochastic model and proposes an effective analytical method to estimate interconnect delay.The technique decouples the stochastic interconnect segments by an improved decoupling method.Combined with a polynomial chaos expression(PCE),this paper applies the stochastic Galerkin method(SGM)to analyze the system response.A finite representation of interconnect delay is then obtained with the complex approximation method and the bisection method.Results from the analysis match well with those from SPICE.Moreover,the method shows good computational efficiency,as the running time is much less than the SPICE simulation's.
%K coupled interconnects
%K process variations
%K stochastic modeling
%K delay estimation
%K stochastic Galerkin method
%K polynomial chaos expression<br>耦合互连线
%K 工艺参数扰动
%K 随机建模
%K 时延估计
%K 随机伽辽金方法
%K 多项式混沌展开
%K coupled
%K interconnects
%K process
%K variations
%K stochastic
%K modeling
%K delay
%K estimation
%K stochastic
%K Galerkin
%K methd
%K polynomial
%K chaos
%K expression
%U http://www.alljournals.cn/get_abstract_url.aspx?pcid=5B3AB970F71A803DEACDC0559115BFCF0A068CD97DD29835&cid=1319827C0C74AAE8D654BEA21B7F54D3&jid=025C8057C4D37C4BA0041DC7DE7C758F&aid=9AD47695BA22FAEB63437E86AAF130D3&yid=67289AFF6305E306&vid=771469D9D58C34FF&iid=0B39A22176CE99FB&sid=8ED630AD8C61FAE8&eid=F637763636425CAF&journal_id=1674-4926&journal_name=半导体学报&referenced_num=0&reference_num=18