%0 Journal Article
%T A Method to Locate Parametric Faults in Analog Integrated Circuits<br>模拟集成电路参数型故障定位方法
%A Xie Yongle
%A Li Xifeng
%A <br>谢永乐
%A 李西峰
%J 半导体学报
%D 2008
%I 
%X Aiming at the problem of testing parametric fault in analog integrated circuits,an approach based on power spectrum correlation analysis for diagnosing parametric faults is presented.After wavelet filter-banks' filtering,the coherence function of the sub-band response sequence is computed.Subsequently,correlation analysis is imposed upon the power spectrum described by the coherence function sequence.As a result,not only can extracting the digital signature of the parametric fault be completed,but also the ...
%K testing of analog integrated circuits
%K fault diagnosis
%K parametric faults
%K fault location
%K coherence function<br>模拟集成电路测试
%K 故障诊断
%K 参数型故障
%K 故障定位
%K 相干函数
%U http://www.alljournals.cn/get_abstract_url.aspx?pcid=5B3AB970F71A803DEACDC0559115BFCF0A068CD97DD29835&cid=1319827C0C74AAE8D654BEA21B7F54D3&jid=025C8057C4D37C4BA0041DC7DE7C758F&aid=57201A4AED4D36E3C01233A5E90F1215&yid=67289AFF6305E306&vid=771469D9D58C34FF&iid=38B194292C032A66&sid=4720E9D07E8A2290&eid=10A39635766FF5D0&journal_id=1674-4926&journal_name=半导体学报&referenced_num=0&reference_num=35