%0 Journal Article
%T Testing content addressable memories with physical fault models<br>Testing Content Addressable Memories with Physical Fault Models
%A Ma Lin
%A Yang Xu
%A Zhong Shiqiang
%A Chen Yunji
%A <br>马麟
%A 杨旭
%A 钟石强
%A 陈云霁
%J 半导体学报
%D 2009
%I 
%X Content addressable memory (CAM) is widely used and its tests mostly use functional fault models. However, functional fault models cannot describe some physical faults exactly. This paper introduces physical fault models for write-only CAM. Two test algor
%K content addressable memory
%K test algorithm
%K physical fault model<br>Content
%K Addressable
%K Memory
%K (CAM)
%K Test
%K Algorithm
%K Physical
%K Fault
%K Model
%U http://www.alljournals.cn/get_abstract_url.aspx?pcid=5B3AB970F71A803DEACDC0559115BFCF0A068CD97DD29835&cid=1319827C0C74AAE8D654BEA21B7F54D3&jid=025C8057C4D37C4BA0041DC7DE7C758F&aid=427A03E4E02BEA949FA7C57588575F5A&yid=DE12191FBD62783C&vid=340AC2BF8E7AB4FD&iid=5D311CA918CA9A03&sid=FCCCBCCAB69B45B6&eid=DF92D298D3FF1E6E&journal_id=1674-4926&journal_name=半导体学报&referenced_num=0&reference_num=8