%0 Journal Article
%T Resonant tunnelling in nc-Si/SiO2 multilayers at room temperature<br>室温下nc-Si/SiO2多层膜结构中的共振隧穿现象
%A Chen Deyuan
%A <br>陈德媛
%J 半导体学报
%D 2011
%I 
%X Nc-Si/SiO2 multilayers were fabricated on silicon wafers in plasma enhanced chemical vapour deposition system using the in situ oxidation technology, followed by the three-step thermal treatments. Carrier transportation at room temperature is characterized by current voltage measurement and negative different conductance can be observed both under forward and negative biases, which is explained by resonant tunnelling. The resonant tunnelling peak voltage is related to the thicknesses of the nc-Si and SiO2 sublayers. And the resonant tunnelling peak voltage under negative bias is larger than that under forward bias. Energy band diagram and equivalent circuit diagram were constructed to analyze and explain the above transportation process and properties.
%K resonant tunnelling
%K work function
%K quantum dots<br>共振隧道
%K 室温
%K 多层膜
%K 化学气相沉积法
%K 共振隧穿
%K 峰值电压
%K 运输过程
%K 等离子增强
%U http://www.alljournals.cn/get_abstract_url.aspx?pcid=5B3AB970F71A803DEACDC0559115BFCF0A068CD97DD29835&cid=1319827C0C74AAE8D654BEA21B7F54D3&jid=025C8057C4D37C4BA0041DC7DE7C758F&aid=C1699E4EE9777022983A7AC7E46B9F9F&yid=9377ED8094509821&vid=9971A5E270697F23&iid=5D311CA918CA9A03&sid=619A74DBE16AC34D&eid=E158A972A605785F&journal_id=1674-4926&journal_name=半导体学报&referenced_num=0&reference_num=7