%0 Journal Article
%T A Transient Method for Testing Thermoelectric Coolers<br>一种测试半导体制冷器的瞬态方法
%A Gong Changmeng
%A Chen Zhen
%A Wu Zhou
%A Chang Guoqiang
%A Qian Ruiming
%A Chen Yunfei
%A <br>宫昌萌
%A 陈震
%A 吴洲
%A 常国强
%A 钱瑞明
%A 陈云飞
%J 半导体学报
%D 2006
%I 
%X The figure of merit ZT,maximum temperature difference,and response time are important parameters for thermoelectric coolers.A transient method for testing these parameters is introduced,and the effect of the heat sink is also discussed.The resistance and Seebeck voltages used to calculate the ZT and the maximum temperature difference are measured using a testing system composed of a DC pulse generator and a DAQ card.The transient method is simple and accurate,and can be used to test thin film thermoelectric coolers.In addition,this method spends very little time.Thus,it can shorten the reliability test period for thermoelectric coolers.A 4mm×4mm×2.4mm commercial thermoelectric cooler is tested using this method.A figure of merit ZT of 0.39,maximum temperature difference of 58.5K,and response time of 20s is measured.
%K thermoelectric cooler
%K transient method
%K resistance voltage
%K Seebeck voltage<br>半导体热电制冷器
%K 瞬态测试方法
%K 电阻电压
%K 塞贝克电压
%K 可靠性测试
%K 半导体
%K 热电制冷器
%K 瞬态方法
%K Thermoelectric
%K Testing
%K Method
%K 最大温差
%K 环境温度
%K 实验
%K 周期
%K 器件测试
%K 薄膜
%K 接触式测量
%K 贝克
%K 电阻
%K 小电流
%K 统测
%K 组成
%K 数据采集卡
%U http://www.alljournals.cn/get_abstract_url.aspx?pcid=5B3AB970F71A803DEACDC0559115BFCF0A068CD97DD29835&cid=1319827C0C74AAE8D654BEA21B7F54D3&jid=025C8057C4D37C4BA0041DC7DE7C758F&aid=879D76B75A11B14E&yid=37904DC365DD7266&vid=DB817633AA4F79B9&iid=94C357A881DFC066&sid=ABE2D40B2765724E&eid=3005465426CC5B70&journal_id=1674-4926&journal_name=半导体学报&referenced_num=1&reference_num=9