%0 Journal Article
%T A New Photoionization Cross Section Measurement Technique Based on PID Control<br>基于PID技术的深能级光离化截面测试方法
%A Wang Ying
%A Li Xinhua
%A <br>王莹
%A 李新化
%J 半导体学报
%D 2008
%I 
%X A new method based on proportional-integral-derivative(PID)control is proposed to measure photoionization cross sections in GaN materials by analysis of release and recaptures carriers of deep centers by incident light.The measurement results of photoionization cross sections on GaN by this method are consistent with the photoionization spectrum in HEMTs reported by Klein.These results indicate that the photoionization cross section technology based on PID control can measure precisely deep level photoioniz...
%K PID<br>光离化截面
%K 深能级中心
%U http://www.alljournals.cn/get_abstract_url.aspx?pcid=5B3AB970F71A803DEACDC0559115BFCF0A068CD97DD29835&cid=1319827C0C74AAE8D654BEA21B7F54D3&jid=025C8057C4D37C4BA0041DC7DE7C758F&aid=E67371165BAF0E5EA87CD9AF9193B2A5&yid=67289AFF6305E306&vid=771469D9D58C34FF&iid=5D311CA918CA9A03&sid=A7E1C896834B988A&eid=7999B0CFB1D30C72&journal_id=1674-4926&journal_name=半导体学报&referenced_num=0&reference_num=5