%0 Journal Article
%T A Testing Method on a Thin Film Transistor Array for Active Matrix Organic Emitting Diode<br>OLED有源驱动TFT阵列的一种测试方法
%A Liu Xueqiang
%A Zhang Tong
%A Wang Lijie
%A Xia Zhiqiang
%A Li Mingyou
%A Liu Shiyong
%A <br>刘雪强
%A 张彤
%A 王丽杰
%A 夏志强
%A 李明友
%A 刘式墉
%J 半导体学报
%D 2007
%I 
%X A novel method is used to evaluate the quality of a TFT array for an active matrix OLED,which can measure the characteristics of TFTs in a 2-T pixel circuit and detect the defects.The proposed testing method is carried out simultaneously with the fabrication processes.Without changing the fabrication processes,only one mask is added to judge the working states of the switch transistor and driving transistor in the pixel circuit.It is a current testing method,which has several advantages including fast response time,high precision,and no damage to the display.
%K thin film transistor
%K organic light emitting diode
%K active matrix driving
%K current test
%K simulation<br>TFT
%K OLED
%K 有源驱动
%K 电流检测
%K 仿真模拟
%U http://www.alljournals.cn/get_abstract_url.aspx?pcid=5B3AB970F71A803DEACDC0559115BFCF0A068CD97DD29835&cid=1319827C0C74AAE8D654BEA21B7F54D3&jid=025C8057C4D37C4BA0041DC7DE7C758F&aid=67EAB27A2105AD53&yid=A732AF04DDA03BB3&vid=D3E34374A0D77D7F&iid=DF92D298D3FF1E6E&sid=ADA74056AD01F4A8&eid=4E85BC78FC25985C&journal_id=1674-4926&journal_name=半导体学报&referenced_num=0&reference_num=8