%0 Journal Article
%T Recoverable Unstable Phenomena in PLED<br>聚合物发光二极管中可逆的不稳定行为
%A LIU En
%A |feng
%A XIONG Shao
%A |zhen
%A ZHAO Ying
%A XIE Wei
%A |liang
%A WU Chun
%A |ya
%A ZHOU Zhen
%A |hua
%A HU Jing
%A |kang
%A ZHANG Wen
%A |wei
%A SHEN Jin
%A |yuan
%A CHEN Jian
%A |sheng
%A ZHANG Yuan
%A |yue
%A ZHANG Li
%A |zhu
%A <br>刘恩峰
%A 熊绍珍
%A 赵颖
%A 谢伟良
%A 吴春亚
%A 周祯华
%A 胡景康张文伟
%A 申金媛
%A 陈建胜
%A 张苑岳
%A 张丽珠
%J 半导体学报
%D 2000
%I 
%X A recoverable negative resistance phenomenon and short\|term degradation in polymer light emitting diode (PLED) have been investigated in this paper. When the bias on the PLED is higher than a certain voltage, an abrupt change will take place in the current and luminance of PLED. It means that the current and luminance of PLED will increase accompanied by the decrease of its voltage. At the same time, the negative phenomenon will disappear gradually along with the increase of measurement times. We use a charge\|coupled device (CCD) pick\|up camera to take images of the abrupt change of luminance and find that the change of luminance corresponds to that of current. The short\|term degradations of luminance under different polar bias are also studied and the negative bias mode is proved to restrain the degradation of luminance effectively. We suspect that the reason for above recoverable but unstable phenomena relates to the defects in PLED and the filling behavior of carriers in it.
%K OLED
%K negative resistance effect
%K recoverable short\|term degradation
%K interface defect<br>有机发光二极管
%K 负阻效应
%K 可恢复的短期衰退
%K 界面处的缺陷
%U http://www.alljournals.cn/get_abstract_url.aspx?pcid=5B3AB970F71A803DEACDC0559115BFCF0A068CD97DD29835&cid=1319827C0C74AAE8D654BEA21B7F54D3&jid=025C8057C4D37C4BA0041DC7DE7C758F&aid=D552E96BCE2B7773&yid=9806D0D4EAA9BED3&vid=659D3B06EBF534A7&iid=B31275AF3241DB2D&sid=28B3EB92D5061EA4&eid=E513158F1BE1471F&journal_id=1674-4926&journal_name=半导体学报&referenced_num=9&reference_num=10