%0 Journal Article
%T Using I-V characteristics to investigate selected contacts for SnO2:F thin films<br>
%A Shadia J Ikhmayies
%A Riyad N Ahmad-Bitar
%A <br>
%J 半导体学报
%D 2012
%I 
%K ohmic contacts
%K I-V characteristics
%K annealing
%K tin oxide<br>
%U http://www.alljournals.cn/get_abstract_url.aspx?pcid=5B3AB970F71A803DEACDC0559115BFCF0A068CD97DD29835&cid=1319827C0C74AAE8D654BEA21B7F54D3&jid=025C8057C4D37C4BA0041DC7DE7C758F&aid=A6275A725A751A6E297B6E6085C18583&yid=99E9153A83D4CB11&vid=27746BCEEE58E9DC&iid=5D311CA918CA9A03&sid=8EFCC795CFD0983E&eid=B31275AF3241DB2D&journal_id=1674-4926&journal_name=半导体学报&referenced_num=0&reference_num=23