%0 Journal Article
%T Mismatch Calibration Techniques in Successive Approximation Analog-to-Digital Converters<br>逐次逼近型模数转换器中的失配校准技术
%A Wang Pei
%A Long Shanli
%A Wu Jianhui
%A <br>王沛
%A 龙善丽
%A 吴建辉
%J 半导体学报
%D 2007
%I 
%X 设计了一种用于逐次逼近型模数转换器中的比较器失调和电容失配自校准电路.通过增加校准周期,该电容自校准结构即可与原电路并行工作,实现高精度与低功耗.校准精度可达14bit.采用该电路设计了一个用于逐次逼近型结构的10bit 3Msps模数转换器单元,该芯片在SMIC 0.18μm 1.8V工艺上实现,总的芯片面积为0.25mm2.芯片实测,在采样频率为1.8MHz,输入320kHz正弦波时,信号噪声失真比为55.9068dB,无杂散动态范围为64.5767dB,总谐波失真为-74.8889dB,功耗为3.1mW.
%K analog-to-digital converter
%K successive approximation
%K self-calibration techniques<br>模数转换器
%K 逐次逼近
%K 自校准技术
%K analog-to-digital
%K converter
%K successive
%K approximation
%K self-calibration
%K techniques
%U http://www.alljournals.cn/get_abstract_url.aspx?pcid=5B3AB970F71A803DEACDC0559115BFCF0A068CD97DD29835&cid=1319827C0C74AAE8D654BEA21B7F54D3&jid=025C8057C4D37C4BA0041DC7DE7C758F&aid=3B07BBDB6A46B5BB&yid=A732AF04DDA03BB3&vid=D3E34374A0D77D7F&iid=9CF7A0430CBB2DFD&sid=01471B003B2963CC&eid=2A46E9718B53247E&journal_id=1674-4926&journal_name=半导体学报&referenced_num=0&reference_num=11