%0 Journal Article
%T An Efficient Test Data Compression Technique Based on Codes
%A Fang Jianping
%A Hao Yue
%A Liu Hongxia
%A Li Kang
%A <br>Fang Jianping
%A Hao Yue
%A Liu Hongxi
%A Li Kang
%J 半导体学报
%D 2005
%I 
%X This paper presents a new test data compression/decompression method for SoC testing,called hybrid run length codes.The method makes a full analysis of the factors which influence test parameters:compression ratio,test application time,and area overhead.To improve the compression ratio,the new method is based on variable-to-variable run length codes,and a novel algorithm is proposed to reorder the test vectors and fill the unspecified bits in the pre-processing step.With a novel on-chip decoder,low test application time and low area overhead are obtained by hybrid run length codes.Finally,an experimental comparison on ISCAS 89 benchmark circuits validates the proposed method.
%K test data compression
%K unspecified bits assignment
%K system-on-a-chip test
%K hybrid run-length codes<br>测试数据压缩
%K 不确定位填充
%K SoC测试
%K 混合游程编码
%K test
%K data
%K compression
%K unspecified
%K bits
%K assignment
%K system-on-a-chip
%K test
%K hybrid
%K run-length
%K codes
%K 编码
%K 硬件开销
%K 测试数据
%K 压缩方法
%K Codes
%K Based
%K Technique
%K Test
%K Data
%K Compression
%K experimental
%K comparison
%K decoder
%K novel
%K algorithm
%K vectors
%K fill
%K bits
%K step
%K new
%K method
%K based
%K improve
%U http://www.alljournals.cn/get_abstract_url.aspx?pcid=5B3AB970F71A803DEACDC0559115BFCF0A068CD97DD29835&cid=1319827C0C74AAE8D654BEA21B7F54D3&jid=025C8057C4D37C4BA0041DC7DE7C758F&aid=6CA1089C6F2DE825&yid=2DD7160C83D0ACED&vid=96C778EE049EE47D&iid=708DD6B15D2464E8&sid=95AF3D35E2988FF4&eid=1A12D34D3633DCF5&journal_id=1674-4926&journal_name=半导体学报&referenced_num=1&reference_num=9