%0 Journal Article
%T Thermal Spectrum Analysis Method for Infrared Thermogram of Transistors<br>晶体管红外热像图的热谱分析方法
%A Zhu Yangjun
%A MIAO Qinghai
%A Zhang Xinghua
%A LU Shuojin
%A <br>朱阳军
%A 苗庆海
%A 张兴华
%A 卢烁今
%J 半导体学报
%D 2005
%I 
%X The infrared thermograms of transistors are investigated according to the colorimetric method.The thermal spectrum curves and one-dimension temperature distribution curves are given from the thermal spectrum analysis.The junction-temperature distribution of the emitter region of the transistors,peak junction temperature,and minimum junction temperature are briefly shown and the average junction temperature is calculated through the one-dimension temperature distribution curves.Transistor thermal spectrum,as a new method,different from the commonly infrared thermogram,is introduced to characterize the non-uniform property of the junction temperature distribution.
%K transistor thermal spectrum
%K peak junction temperature
%K infrared thermogram
%K normalized area<br>晶体管热谱
%K 峰值结温
%K 红外热像图
%K 归一化面积
%U http://www.alljournals.cn/get_abstract_url.aspx?pcid=5B3AB970F71A803DEACDC0559115BFCF0A068CD97DD29835&cid=1319827C0C74AAE8D654BEA21B7F54D3&jid=025C8057C4D37C4BA0041DC7DE7C758F&aid=985F9E5614B08F13&yid=2DD7160C83D0ACED&vid=96C778EE049EE47D&iid=DF92D298D3FF1E6E&sid=A268BE393F034483&eid=5A64531D29896B77&journal_id=1674-4926&journal_name=半导体学报&referenced_num=2&reference_num=6