%0 Journal Article
%T Boundary Element Method for Extraction Substrate Coupling Parameter in Mixed-Signal ICs<br>边界元法在数模混合集成电路衬底耦合参数提取中的应用
%A WU Zhi
%A HUANG Jun
%A |nai
%A TANG Pu
%A |shan
%A <br>吴智
%A 黄均鼐
%A 唐璞山
%J 半导体学报
%D 2000
%I 
%X Boundary Element Method(BEM) is used in substrate coupling parameter extraction of mixed\|signal ICs. Green Function that satisfies the substrate boundary conditions is solved out in this paper. Using this Green Function instead of the Green Function in free space makes only the ports area on the substrate top surface need to be discretized. Discrete Cosine Transform which is based on FFT is used when determine impedance element, which improves the solution speed dramatically. Comparing to Finite Difference Method, the solution speed is improved by one order of magnitude, but the accuracy is kept. Comparing to Wemple's result where Voronoi tessellation is used to partition the layout and analytical method is used to compute substrate coupling, the accuracy of BEM is improved significantly.
%K boundary element
%K Green function
%K mixed\|signal ICs<br>边界元
%K 格林函数
%K 数模混合集成电路
%U http://www.alljournals.cn/get_abstract_url.aspx?pcid=5B3AB970F71A803DEACDC0559115BFCF0A068CD97DD29835&cid=1319827C0C74AAE8D654BEA21B7F54D3&jid=025C8057C4D37C4BA0041DC7DE7C758F&aid=61A1F4F34FE7EE49&yid=9806D0D4EAA9BED3&vid=659D3B06EBF534A7&iid=94C357A881DFC066&sid=C4490A71BEB872FA&eid=9296A146D1D94BC4&journal_id=1674-4926&journal_name=半导体学报&referenced_num=1&reference_num=10