%0 Journal Article %T Structural Investigation of InGaAs/InP Quantum Wire Array Using Triple-Axis X-ray Diffractometry %A 马文全 %A 王玉田 %A 庄岩 %A 江德生 %A 朱洪亮 %A 张静媛 %A 段俐宏 %A 王圩 %J 半导体学报 %D 1998 %I %X HighresolutionX-raydifractometryisaveryimportantandindispensabletoolforcharacterizationofepitaxiallayers,hetero-structuraland... %U http://www.alljournals.cn/get_abstract_url.aspx?pcid=5B3AB970F71A803DEACDC0559115BFCF0A068CD97DD29835&cid=1319827C0C74AAE8D654BEA21B7F54D3&jid=025C8057C4D37C4BA0041DC7DE7C758F&aid=096B6DED4F40BA56&yid=8CAA3A429E3EA654&vid=2A8D03AD8076A2E3&iid=CA4FD0336C81A37A&sid=1D0FA33DA02ABACD&eid=8BD23BD67BF01A5C&journal_id=1674-4926&journal_name=半导体学报&referenced_num=0&reference_num=0