%0 Journal Article
%T Sub-Microscale Temperature Distributions Measured by Scanning Thermal Microscopy<br>用扫描热显微镜测量亚微米尺度的局域热参数分布
%A XIE Zhi
%A |gang
%A HAN Li
%A DONG Zhan
%A |min
%A WANG Xiu
%A |feng
%A CHEN Hao
%A |ming
%A GU Yu
%A |qin
%A JIN Hong
%A |shi
%A <br>谢志刚
%A 韩立
%A 董占民
%A 王秀凤
%A 陈皓明
%A 顾毓沁
%A 晋宏师
%J 半导体学报
%D 2000
%I 
%X On the basis of thermal resistance network model,the heat conduction mechanism of a resistive\|type thermal probe is analyzed. It is demonstrated that not only the temperature distribution,but also the thermal conductivity of the sample surface can be mapped in a passive mode. Thermal bridge and semiconductor laser are investigated by combining both STM and AFM.
%K Scanning Thermal Microscope
%K thermal parameter
%K thermal bridge
%K semiconductor laser<br>扫描热显微镜
%K 热参数
%K 热桥
%K 半导体激光器
%U http://www.alljournals.cn/get_abstract_url.aspx?pcid=5B3AB970F71A803DEACDC0559115BFCF0A068CD97DD29835&cid=1319827C0C74AAE8D654BEA21B7F54D3&jid=025C8057C4D37C4BA0041DC7DE7C758F&aid=A9818C7EB23C637A&yid=9806D0D4EAA9BED3&vid=659D3B06EBF534A7&iid=B31275AF3241DB2D&sid=E6A0A363CA4FC5CF&eid=23F919F7BAF87909&journal_id=1674-4926&journal_name=半导体学报&referenced_num=0&reference_num=9