%0 Journal Article
%T Progress in the Imaging of Nanoscale Ferroelectric Domain via Scanning Force Microscope<br>纳米尺度铁电畴的扫描力显微镜成像研究进展
%A ZENG Hua-Rong
%A FANG Jian-Wen
%A HUI Sen-Xing
%A LI Guo-Rong
%A YIN Qing-Rui
%A <br>曾华荣
%A 方健文
%A 惠森兴
%A 李国荣
%A 殷庆瑞
%J 无机材料学报
%D 2002
%I Science Press
%X Scanning force microscope (SFM) is paid great attention as a super-resolutional near-field scanning probe microscope in all circles. SFM is becoming a powerful technique with great potential for imaging and control of nanoscale domain structures in ferroelectric materials, and it is a promising technique well suited for nanoscale investigation of local properties including ferroelectricity, piezoelectricity, dielectricity in ferroelectics. This review is involved with the latest progress in the imaging principle of nanoscale ferroelectric domain via SFM.
%K nanoscale
%K ferroelectric domain
%K scanning force microscope<br>扫描力显微镜成像
%K 研究进展
%K 纳米尺度
%K 铁电畴
%K 铁电材料
%U http://www.alljournals.cn/get_abstract_url.aspx?pcid=5B3AB970F71A803DEACDC0559115BFCF0A068CD97DD29835&cid=84529CA2B2E519AC&jid=ABC0063016AF57E1C73EF43C8D2212BD&aid=D5E05E9EF0B06A81&yid=C3ACC247184A22C1&vid=BCA2697F357F2001&iid=B31275AF3241DB2D&sid=4814830A427BF9BC&eid=E26AA41AE15D3061&journal_id=1000-324X&journal_name=无机材料学报&referenced_num=1&reference_num=50