%0 Journal Article
%T Direct method of determining the lattice parameters of a phase from X-ray diffraction pattern of multi-phase<br>X射线衍射多相谱中某一物相点阵参数的直接求解方法
%A Xu Xiao-Ming
%A Miao Wei
%A Tao Kun
%A <br>徐晓明
%A 苗伟
%A 陶琨
%J 物理学报
%D 2011
%I 
%X A new method of determining lattice parameters by peak fitting of X-ray diffraction pattern, without involving structure parameters, is introduced. The method can be applied to a single phase and one phase in multi-phase diffraction patterns. It can avoid getting different fitting results caused by using different extrapolation functions, and can get a more accurate result in a short time. The application program of the method has been used in the practical work. For improving the fitting accuracy, the program can also adjust off-axis deviation of the sample surface and the goniometric mechanical zero.
%K X-ray diffraction
%K peak fitting
%K lattice parameter<br>X射线衍射
%K 谱峰拟合
%K 点阵参数
%U http://www.alljournals.cn/get_abstract_url.aspx?pcid=6E709DC38FA1D09A4B578DD0906875B5B44D4D294832BB8E&cid=47EA7CFDDEBB28E0&jid=29DF2CB55EF687E7EFA80DFD4B978260&aid=95DC14E13B3C2ACC36AA885EBAE1840B&yid=9377ED8094509821&vid=BFE7933E5EEA150D&iid=5D311CA918CA9A03&sid=42D95B5083B2EB34&eid=42D95B5083B2EB34&journal_id=1000-3290&journal_name=物理学报&referenced_num=0&reference_num=7